MILPRF50884F
APPENDIX A
A.3.5.2.5.2 Rectangular surface mount lands (see figure F6). Rectangular surface mount lands shall not contain
defects such as nicks, dents, and pin holes along the external edge of the land that exceed 20 percent of either the
length or width of the land and shall not encroach the pristine area, which is defined by the central 80 percent of the
land width by 80 percent of the land length as shown on figure F6. Defects internal to the land shall not exceed 10
percent of the length or width of the land and shall remain outside of the pristine area of the surface mount land.
Electrical test probe 'witness' marks shall be acceptyable when within the pristine area.
A.3.5.2.5.3 Round surface mount lands and Ball Grid Array pads (see figure F7). Round surface mount lands
and Ball Grid Array (BGA) pads shall not contain defects such as nick, dents and pin holes along the edge of the land
that radially extend towards the center of the land by more than 10 percent of the diameter of the land. In addition,
defects shall not extend more than 20 percent of the circumference of the land as shown on figure F7. There shall
be no defects within the pristine area which is defined by the central 80 percent of the land diameter. Electrical test
probe 'witness' marks shall be acceptable when within the pristine area.
A.3.5.2.5.4 Wire bond pads. The maximum conductor finish roughness (surface roughness) for pads or areas
designated for wire bonding shall be no greater than 32 micro inches (0.8 micrometers). Unless otherwise specified,
the wire bond pad bonding area shall be defined as the pristine area as shown on figure F6 for rectangular pads or
figure F7 for round pads. There shall be no pits, nodules, scratches, electrical test probe 'witness' marks, or other
defects in the pristine area that exceed the surface roughness limits.
A.3.5.2.6 Holes for interlayer connections. The external annular ring of holes used for interlayer connections shall
be as specified. Unless otherwise specified, the external annular ring may have in isolated areas a 20 percent
reduction of the specified minimum external annular ring due to defects such as dents, pinholes, pits, or nicks.
A.3.5.2.7 Registration, external (method I).
A.3.5.2.7.1 Component hole lands Misregistration of component hole lands shall not reduce the minimum external
annular ring below the limits specified (see A.3.1.1).
A.3.5.2.7.2 Rectangular surface mount lands. The registration of rectangular surface mount lands shall be as
specified (see A.3.1.1).
A.3.5.2.7.3 Round surface mount lands. Round surface mount lands, such as Ball Grid Array (BGA) lands, using
copperdefined lands, solder mask-defined lands, or solder dam designs shall comply with IPC7095.
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